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Study on an evaluation method of micro CMM spherical stylus tips by μ-EDM on-machine measurement

研究成果: 期刊貢獻文章同行評審

19 引文 斯高帕斯(Scopus)

摘要

This paper describes an on-machine measurement function of a micro electro-discharge machine (μ-EDM) to evaluate the quality of micro ball-ended stylus tips fabricated by a combination of wire-electro-discharge grinding (WEDG) and one-pulse-electro-discharge (OPED) technology. A low-voltage contacting trigger function without any capacitor between a stationary wire and the spindle of a μ-EDM was used to measure the outer profile and evaluate the forming quality. The measurement results show that the deviation of the largest radius between the micro ball-ended tip and stem is approximately 3 μm. Moreover, OPED/WEDG is also easily able to produce high-quality micro spherical stylus tips with a standard deviation as small as 0.7 μm through use of sharp-needle-shaped electrode tools. With further improvements in electro-discharge position, OPED and WEDG technology are promising and excellent approaches for manufacturing micro coordinate measurement machine (CMM) spherical stylus tips.

原文English
文章編號075003
期刊Journal of Micromechanics and Microengineering
20
發行號7
DOIs
出版狀態Published - 2010

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