摘要
Sb-doped AgIn5S8 polycrystalline films were grown on indium-tin-oxide coated glass substrates using solution growth technique. New procedures for growing Sb-doped Ag-In-S system photocatalyst films are presented. The influences of various deposition parameters on structural, optical, and photoelectrochemical properties of samples were investigated. The X-ray diffraction patterns of samples demonstrate the presence of polycrystalline AgIn5S8 phase in these films. The thicknesses and energy band gaps obtained from transmittance data are in the ranges of 538-1018 nm and 1.72-1.73 eV, respectively. The flat band potentials of these samples are in the range of -4.097 to -5.217 V vs. an absolute electron potential; the potentials become more negative with an increase in Sb ion in reaction solution. With a molar ratio of Sb/Ag in precursor solution higher than 0.2, the conduction type of samples turns into p-type semiconductor. The maximum photocurrent density of samples with an external potential set at 3.5 V was found to be -4.76 mA/cm2 under illumination using a 300 Xe lamp system. Crown
| 原文 | English |
|---|---|
| 頁(從 - 到) | 74-79 |
| 頁數 | 6 |
| 期刊 | Chemical Engineering Science |
| 卷 | 65 |
| 發行號 | 1 |
| DOIs | |
| 出版狀態 | Published - 2010 |
文獻附註
Funding Information:The authors are grateful to the National Science Council of the ROC (Grant no. NSC 97-2221-E-182-041-MY3) and the Bureau of Energy, Ministry of Economic Affairs of the ROC (Grant No. 7455VH7200) for supporting this study. The authors would like to thank the Microscopic Center at Chang Gung University and the Nanotechnology R&D Center at Kun Shan University for SEM-EDAX analysis and FE-SEM micrographs.
指紋
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