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Computer controlled measuring center

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摘要

This paper demonstrated a novel computer controlled measuring center (CCMC) including multiple fully modular and functional measuring probes or instruments, a common multi-axis motion platform or probe station, a common digital image guiding device, and a common data acquisition and processing module. The device under test (DUT) is fixed in the fixture of the motion platform. According to the desired measuring items, the corresponding required measuring probes from different vendors are installed into a probe fetching-fixture by a probe-changing-mechanism. The probe fetching-fixture can rotate in three directions, such as pitch, roll, and yaw. Combining with the digital image guiding device the probes can align and measure the specific point or area of the DUT. In this way the CCMC can measure more than one parameter of the DUT at the same point or perform a variety of measurements with only one floor area of traditional measuring equipment.

原文English
主出版物標題Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005
頁面238-243
頁數6
出版狀態Published - 2005
事件2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005 - Edmonton, Canada
持續時間: 1 8月 20052 8月 2005

出版系列

名字Proceedings of the 2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005
2005

Conference

Conference2005 IEEE Conference on Automation Science and Engineering, IEEE-CASE 2005
國家/地區Canada
城市Edmonton
期間1/08/052/08/05

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