摘要
Silicon growth from Si-Fe melts was investigated in view of producing high-quality Si using induced temperature gradients. Scanning electron microscopy coupled with energy-dispersive spectroscopy and micro-computed tomography analyses were used to characterize the quality of bulk Si, in particular its microstructure and purity. The migration of Si and Fe atoms along a temperature gradient in the mushy zone of the Si-Fe alloy was evidenced, which became the source of Si precipitation on the C substrate, and ultimately forming bulk Si. Furthermore, the content of residual Fe-Si can be decreased in the bulk Si by controlling the temperature gradient, the holding time, and the alloy composition.
| 原文 | English |
|---|---|
| 頁(從 - 到) | 12595-12603 |
| 頁數 | 9 |
| 期刊 | Journal of Materials Research and Technology |
| 卷 | 9 |
| 發行號 | 6 |
| DOIs | |
| 出版狀態 | Published - 11月 2020 |
文獻附註
Publisher Copyright:© 2020 The Author(s).
指紋
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