A study of impulsive noise immunity for wavelet-OFDM-based power line communications

Hao Chun Yu; Ying Ren Chien; Hen Wai Tsao

doi:10.1109/ICCPS.2016.7751103

A study of impulsive noise immunity for wavelet-OFDM-based power line communications

Hao Chun Yu
, Ying Ren Chien
, Hen Wai Tsao

電子工程系

研究成果: 書籍/報告/會議論文中的章節 › 會議投稿 › 同行評審

8 引文斯高帕斯（Scopus）

摘要

In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.

原文	English
主出版物標題	2016 International Conference on Communication Problem-Solving, ICCP 2016
發行者	Institute of Electrical and Electronics Engineers Inc.
ISBN（電子）	9781509013838
DOIs	https://doi.org/10.1109/ICCPS.2016.7751103
出版狀態	Published - 21 11月 2016
事件	2016 International Conference on Communication Problem-Solving, ICCP 2016 - Taipei, Taiwan 持續時間: 7 9月 2016 → 9 9月 2016

出版系列

名字	2016 International Conference on Communication Problem-Solving, ICCP 2016

Conference

Conference	2016 International Conference on Communication Problem-Solving, ICCP 2016
國家/地區	Taiwan
城市	Taipei
期間	7/09/16 → 9/09/16

文獻附註

Publisher Copyright:
© 2016 IEEE.

存取文件

10.1109/ICCPS.2016.7751103

其它文件與鏈接

Link to publication in Scopus

引用此

Yu, H. C., Chien, Y. R., & Tsao, H. W. (2016). A study of impulsive noise immunity for wavelet-OFDM-based power line communications. 於 2016 International Conference on Communication Problem-Solving, ICCP 2016 文章 7751103 (2016 International Conference on Communication Problem-Solving, ICCP 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCPS.2016.7751103

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title = "A study of impulsive noise immunity for wavelet-OFDM-based power line communications",

abstract = "In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.",

keywords = "IEEE P1901, Impulsive Noise, Wavelet-OFDM",

author = "Yu, \{Hao Chun\} and Chien, \{Ying Ren\} and Tsao, \{Hen Wai\}",

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Yu, HC, Chien, YR & Tsao, HW 2016, A study of impulsive noise immunity for wavelet-OFDM-based power line communications. 於 2016 International Conference on Communication Problem-Solving, ICCP 2016., 7751103, 2016 International Conference on Communication Problem-Solving, ICCP 2016, Institute of Electrical and Electronics Engineers Inc., 2016 International Conference on Communication Problem-Solving, ICCP 2016, Taipei, Taiwan, 7/09/16. https://doi.org/10.1109/ICCPS.2016.7751103

A study of impulsive noise immunity for wavelet-OFDM-based power line communications. / Yu, Hao Chun; Chien, Ying Ren; Tsao, Hen Wai.
2016 International Conference on Communication Problem-Solving, ICCP 2016. Institute of Electrical and Electronics Engineers Inc., 2016. 7751103 (2016 International Conference on Communication Problem-Solving, ICCP 2016).

研究成果: 書籍/報告/會議論文中的章節 › 會議投稿 › 同行評審

TY - GEN

T1 - A study of impulsive noise immunity for wavelet-OFDM-based power line communications

AU - Yu, Hao Chun

AU - Chien, Ying Ren

AU - Tsao, Hen Wai

PY - 2016/11/21

Y1 - 2016/11/21

N2 - In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.

AB - In the specification of IEEE P1901-2010, which is the standard for high speed communication devices via electric power lines, two physical layer technologies are defined. One is called fast Fourier transform (FFT)-based orthogonal frequency-division multiplexing (OFDM) and the other is wavelet-based OFDM (Wavelet-OFDM). However, few studies have been discussed the impact of impulsive noise (IN) for Wavelet-OFDM-based PLC systems. This paper preliminarily study the impact of IN on both FFT-OFDM and Wavelet-OFDM-based PLC systems in additive white Gaussian noise (AWGN) channel model. Due to the overlapping in time domain, the Wavelet-OFDM become more prone to IN than the FFT-OFDM.

KW - IEEE P1901

KW - Impulsive Noise

KW - Wavelet-OFDM

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Y2 - 7 September 2016 through 9 September 2016

ER -

A study of impulsive noise immunity for wavelet-OFDM-based power line communications

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