摘要
An integrated differential CMOS low-noise amplifier (LNA) with high gain, low dc power consumption, and low noise figure is presented in this paper. By introducing a current-reused negative-conductance accommodation structure to a differential LNA, the transconductance of the LNA can be effectively increased, leading to a performance enhanced differential LNA. To characterize the performance improvement of the differential LNA, two differential LNAs with and without the 33.3% current-reused negative-conductance accommodation structure were designed and fabricated for comparison. At supply voltages of 0.65-V VDD1 and 1.2-V VDD2, the measured gain of the differential LNA can be significantly improved from 13.1 dB to 15.8 dB, leading to a remarkable 2.7-dB gain increment. The measured dc power dissipation of the presented differential LNA with negative-conductance accommodation structure is 11.48 mW. In addition, the measured noise figure of the differential LNA with a current-reused negative-conductance accommodation structure is 3.3 dB. Compared to previously published 0.18-μm CMOS LNAs at the same frequency of interest, the proposed differential LNA with the current-reused negative-conductance accommodation structure achieves the high gain, low dc power dissipation, and low noise figure.
| 原文 | English |
|---|---|
| 主出版物標題 | Proceedings - 28th IEEE International System on Chip Conference, SOCC 2015 |
| 編輯 | Thomas Buchner, Danella Zhao, Karan Bhatia, Ramalingam Sridhar |
| 發行者 | IEEE Computer Society |
| 頁面 | 78-81 |
| 頁數 | 4 |
| ISBN(電子) | 9781467390934 |
| DOIs | |
| 出版狀態 | Published - 12 2月 2016 |
| 事件 | 28th IEEE International System on Chip Conference, SOCC 2015 - Beijing, China 持續時間: 8 9月 2015 → 11 9月 2015 |
出版系列
| 名字 | International System on Chip Conference |
|---|---|
| 卷 | 2016-February |
| ISSN(列印) | 2164-1676 |
| ISSN(電子) | 2164-1706 |
Conference
| Conference | 28th IEEE International System on Chip Conference, SOCC 2015 |
|---|---|
| 國家/地區 | China |
| 城市 | Beijing |
| 期間 | 8/09/15 → 11/09/15 |
文獻附註
Publisher Copyright:© 2015 IEEE.
指紋
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