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Substrate effect on characteristics of PbZrxTi 1-xO3 (PZT) film

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Abstract

The paper presents the effect of substrates on the characteristics of PbZrxTi1-xO3 (PZT) thin film fabricated by sol-gel spin coating technology. The PZT sol-gel is prepared by mixing PZT powder and PZT solution, and fabricated on various substrates, including copper (Cu), alumina (Al2O3), stainless steel (SS) and titanium (Ti). The dielectric characteristics and orientation of films had been measured by SEM, LCR meter, XRD for comparison. The experimental results indicate that the substrates having the similar characteristics with PZT film would result in better crystallization, charge storage capacity and energy transfer efficiency of film.

Original languageEnglish
Pages (from-to)51-58
Number of pages8
JournalIntegrated Ferroelectrics
Volume150
Issue number1
DOIs
StatePublished - 2 Jan 2014

Bibliographical note

Funding Information:
This work was sponsored by the national science council of the Republic of China under the grant No. NSC 101-2221-E-164-007.

Keywords

  • PZT film
  • dielectric
  • orientation
  • spin
  • substrate
  • thermal expansion coefficient

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