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Study on an evaluation method of micro CMM spherical stylus tips by μ-EDM on-machine measurement

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Abstract

This paper describes an on-machine measurement function of a micro electro-discharge machine (μ-EDM) to evaluate the quality of micro ball-ended stylus tips fabricated by a combination of wire-electro-discharge grinding (WEDG) and one-pulse-electro-discharge (OPED) technology. A low-voltage contacting trigger function without any capacitor between a stationary wire and the spindle of a μ-EDM was used to measure the outer profile and evaluate the forming quality. The measurement results show that the deviation of the largest radius between the micro ball-ended tip and stem is approximately 3 μm. Moreover, OPED/WEDG is also easily able to produce high-quality micro spherical stylus tips with a standard deviation as small as 0.7 μm through use of sharp-needle-shaped electrode tools. With further improvements in electro-discharge position, OPED and WEDG technology are promising and excellent approaches for manufacturing micro coordinate measurement machine (CMM) spherical stylus tips.

Original languageEnglish
Article number075003
JournalJournal of Micromechanics and Microengineering
Volume20
Issue number7
DOIs
StatePublished - 2010

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