Skip to main navigation Skip to search Skip to main content

Reducing in dark count rate using a dual-APDs balanced-capacitance self-differencing scheme for 1550 nm single photon detection applications

  • Wen Jeng Ho
  • , Jheng Jie Liu
  • , Jhe Min Lin
  • , Yi Yu Lee
  • , Yi Chia Hsieh
  • , Hsuan Ming Tang

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Single-photon performances characterization of InGaAs/InP avalanche photodiodes (APDs) using a dual-APDs balanced-capacitance self-differencing operation was proposed. Small spike-noise and low discrimination-level were simultaneously achieved. Reducing in dark-count rate was also presented in the proposed scheme.

Original languageEnglish
Title of host publication2011 Int. Quantum Electr. Conf., IQEC 2011 Conf Lasers Electro-Optics, CLEO Pacific Rim 2011 Incorporating Australasian Conf. on Optics, Lasers Spectrosc. Australian Conf. Optical Fibre Technol.- Conf
Pages1972-1974
Number of pages3
DOIs
StatePublished - 2011
Event2011 International Quantum Electronics Conference, IQEC 2011 and Conference on Lasers and Electro-Optics, CLEO Pacific Rim 2011 - Sydney, NSW, Australia
Duration: 28 Aug 20111 Sep 2011

Publication series

Name2011 Int. Quantum Electron. Conf., IQEC 2011 and Conf. Lasers and Electro-Optics, CLEO Pacific Rim 2011 Incorporating the Australasian Conf. Optics, Lasers and Spectroscopy and the Australian Conf.

Conference

Conference2011 International Quantum Electronics Conference, IQEC 2011 and Conference on Lasers and Electro-Optics, CLEO Pacific Rim 2011
Country/TerritoryAustralia
CitySydney, NSW
Period28/08/111/09/11

Fingerprint

Dive into the research topics of 'Reducing in dark count rate using a dual-APDs balanced-capacitance self-differencing scheme for 1550 nm single photon detection applications'. Together they form a unique fingerprint.

Cite this