Radar Imaging Statistics of Non-Gaussian Rough Surface: A Physics-Based Simulation Study

This paper investigates the radar image statistics of rough surfaces by simulating the scattered signal’s dependence on the surface roughness. Statistically, the roughness characteristics include the height probability density (HPD) and, to the second-order, the power spectral density (PSD). We simulated the radar backscattered signal by computing the far-field scattered field from the rough surface within the antenna beam volume in the context of synthetic aperture radar (SAR) imaging. To account for the non-Gaussian height distribution, we consider microscopic details of the roughness on comparable radar wavelength scales to include specularly, singly, and multiply scatterers. We introduce surface roughness index (RSI) to distinguish the statistical characteristics of rough surfaces with different height distributions. Results suggest that increasing the RMS height does not impact the Gaussian HPD surface but significantly affects the Weibull surface. The results confirm that as the radar frequency increases, or reaches a relatively larger roughness, the surface’s HPD causes significant changes in incoherent scattering due to more frequent multiple scattering contributions. As a result, the speckle move further away from the Rayleigh model. By examining individual RSI, we see that the Gaussian HPD surface is much less sensitive to RMS height than the Weibull HPD surface. We demonstrate that to retrieve the surface parameters (both dielectric and roughness) from the estimated RCS, less accuracy is expected for the non-Gaussian surface than the Gaussian surface under the same conditions. Therefore, results drawn from this study are helpful for system performance evaluations, parameters estimation, and target detection for SAR imaging of a rough surface.