Abstract
A series of copolymers of tetrafluoroethylene and 4-trifluormethoxy-1,3- perfluorodioxole (TFETFMD) were prepared as well as a homopolymer of the dioxole (TEMD) using various free-radical initiators. The copolymers were characterized by 19F NMR, TGA, DSC and VUV measurements. The transparency at 157nm increased with increasing dioxole content reaching an α (μm -1) = 0.76 for an unoptimized homopolymer of the dioxole prepared with a perfluorinated peroxide initiator. Exposure studies of the dioxole homopolymer at 157 nm indicate rapid formation of carbonyl species and therefore an anticipated short lifetime as a potential polymer pellicle for 157 nm lithography.
| Original language | English |
|---|---|
| Pages (from-to) | 651-653 |
| Number of pages | 3 |
| Journal | Journal of Photopolymer Science and Technology |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| State | Published - 2004 |
Keywords
- 157 nm lithography
- Perflurodioxole
- Polymer pellicle
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