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Electrical and optical characterization of thermally deposited indium-Tin-oxide film on high efficiency single-junction GaAs solar cell

  • Jian Cheng Lin
  • , Wen Jeng Ho
  • , Wen Bin Bai
  • , Jheng Jie Liu
  • , Hung Pin Shiao

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Scopus citations

Abstract

The thermally deposited indium-Tin-oxide (ITO) film on single-junction GaAs solar-cell as an excellent antireflection, passivation and window layer to achieve higher efficiency is demonstrated. The passivated characteristic of the ITO-film on GaAs solar-cell is examined by saturation-current and ideality factor. The antireflection of the ITO-film on GaAs solar-cell is revealed by optical-reflectance and external quantum-efficiency. The efficiency of 23.52% for the GaAs cell with ITO antireflection-coating (ARC) was higher than that of 21.92% for the GaAs cell with SiO2 ARC.

Original languageEnglish
Title of host publicationProceedings of the 2017 IEEE International Conference on Applied System Innovation
Subtitle of host publicationApplied System Innovation for Modern Technology, ICASI 2017
EditorsTeen-Hang Meen, Artde Donald Kin-Tak Lam, Stephen D. Prior
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages1805-1807
Number of pages3
ISBN (Electronic)9781509048977
DOIs
StatePublished - 21 Jul 2017
Event2017 IEEE International Conference on Applied System Innovation, ICASI 2017 - Sapporo, Japan
Duration: 13 May 201717 May 2017

Publication series

NameProceedings of the 2017 IEEE International Conference on Applied System Innovation: Applied System Innovation for Modern Technology, ICASI 2017

Conference

Conference2017 IEEE International Conference on Applied System Innovation, ICASI 2017
Country/TerritoryJapan
CitySapporo
Period13/05/1717/05/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

  • Antireflection-coating (ARC)
  • GaAs solar cell
  • High efficiency
  • Indium-Tin-oxide (ITO)
  • Passivation

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