Abstract
Silicon growth from Si-Fe melts was investigated in view of producing high-quality Si using induced temperature gradients. Scanning electron microscopy coupled with energy-dispersive spectroscopy and micro-computed tomography analyses were used to characterize the quality of bulk Si, in particular its microstructure and purity. The migration of Si and Fe atoms along a temperature gradient in the mushy zone of the Si-Fe alloy was evidenced, which became the source of Si precipitation on the C substrate, and ultimately forming bulk Si. Furthermore, the content of residual Fe-Si can be decreased in the bulk Si by controlling the temperature gradient, the holding time, and the alloy composition.
| Original language | English |
|---|---|
| Pages (from-to) | 12595-12603 |
| Number of pages | 9 |
| Journal | Journal of Materials Research and Technology |
| Volume | 9 |
| Issue number | 6 |
| DOIs | |
| State | Published - Nov 2020 |
Bibliographical note
Publisher Copyright:© 2020 The Author(s).
Keywords
- Bulk Si
- Characterization
- Si-Fe alloy
- Temperature gradient
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